Title: Gamma degradation models and associated inference

Abstract:
    In this talk, I will introduce the concept of degradation modeling in reliability literature.  I shall then introduce two popular degradation models, namely, the Wiener process and gamma degradation process.  I shall then focus on inferential methods for gamma degradation models, both fixed effects and random effects, and describe their use with a real life data.  If time permits, I shall describe also an optimal design problem associated with gamma degradation model.
Lecturer: Narayanaswamy Balakrishnan
Date/Time: 24th May, 2019 14:00-15:00
Location: Room 706, CEM Building, Jiangjun Rd. Campus
Brief introduction of the lecturer:
    Narayanaswamy Balakrishnan is a Distinguished Professor in Department of Mathematics & Statistics, in McMaster University. He received his PhD degree in Statistics from Indian Institute of Technology in 1981. He was Elected Member of the International Statistical Institute in 1992, Fellow of American Statistical Association in 1995, Fellow of Turkish Statistical Association in 2003, Fellow of Institute of Mathematics Statistics in 2006, Elected Honorary Member of the Greek Statistical Institute in 2007, etc. He was awarded Don Owen Award winner by the American Association in 2008, and was awarded Valuable Service Award winner by the International Statistical Association in 2010. He has authored more than 40 books and published more than 200 papers. He has also completed 51 PhD. Thesis Supervisions and over 50 M.Sc. Project/Thesis Supervisions. In the past, he was Associate Editor for Journal of Statistics Planning and Inference, IEEE Transaction on Reliability, Naval Research Logistics and many others. At present, he is Editor in Chief for Communications in Statistics-Theory and Methods, Communications in Statistics-Simulation and Computation, Communications in Statistics-Case Studies, Data Analysis and Applications, the Revised Edition of Encyclopedia of Statistical Sciences, the Series Statistics for Industry and Technology of books and volumes, the Series Handbooks on Methods and Applications of Statistics, the Series Statistics of books and monographs, etc.